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Electron Microscopy

The function of the Central Facility for Electron Microscopy is to provide hands-on access to electron microscopes, sample preparation equipment plus data collection and data reduction instrumentation, along with advice, training and research collaboration. The scope of the Facility is materials characterization of the topography, morphology, elemental composition, crystalline microstructure, crystal defects, and atomic arrangements of materials, largely on a scale from 10 micrometers down to the near-atomic level.


  1. FEI Nova NanoSEM 450

    Field emission SEM with ultra-stable, high current Schottky gun. Advanced optics and detection, including immersion mode, beam deceleration, in-lens TLD-SE and -BSE, DBS and STEM for best selection of the information and image optimization.

  2. FEI Tecnai Osiris (S)TEM

    Fully digital 200 kV TEM and STEM system including the HAADF detector X-FEG high brightness Schottky FEG. 

  3. JEOL JEM 2010 TEM

    200kV, analytical/high-resolution mode, LaB6 filament, single-tilting and double-tilting sample holders. (Oxford EDS system, Gatan dual-view CCD camera, TSL texture analysis system, Digi-TEM beam control system).

  4. JEOL JSM 840A SEM

    LaB6 filament, second electron and backscattered electron detectors, Kevex Quantum x-ray microanalyzer, Digital imaging system.