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Program Application

Image Analysis and Processing

Instrument

AFM-Bruker Dimension Icon; contact mode, tapping mode, peakforce tapping, PFQNM, MFM, PRM, EFM, PFKPFM, and SCM @ Materials Characterization Lab @ Center for Nanoscale Science
AFM-Dimension 3100; contact mode, tapping mode, and phase imaging @ Materials Characterization Lab @ Center for Nanoscale Science
Cressington Carbon Coater @ Imaging and Analysis Center @ Princeton Center for Complex Materials
Diamond Knives @ Imaging and Analysis Center @ Princeton Center for Complex Materials
Dimpler @ Imaging and Analysis Center @ Princeton Center for Complex Materials
ESEM-FEI Quanta 200 Environmental SEM; 10nm Resolution, BSE, EDS, and Temperature Control @ Materials Characterization Lab @ Center for Nanoscale Science
Evactron Plasma Cleaner @ Imaging and Analysis Center @ Princeton Center for Complex Materials
FEI Vitrobot Units @ Imaging and Analysis Center @ Princeton Center for Complex Materials
FESEM-FEI NanoSEM 630; 1.7nm Resolution, BSE, EDS, Beam Deceleration @ Materials Characterization Lab @ Center for Nanoscale Science
FIB-FEI Quanta 200 3D FIB; 3.5nm SEM Resolution, 10nm Ga+ Beam, Pt GIS, and Selective Carbon Etch GIS @ Materials Characterization Lab @ Center for Nanoscale Science
FIB-FEI Helios NanoLab 660; DualBeam SEM/FIB Platform-pushing the limits of extreme high resolution characterization in 2D an 3D, nanoprototyping, and sample preparation @ Materials Characterization Lab @ Center for Nanoscale Science
Fischione 1010 dual-beam Ion Mill @ Imaging and Analysis Center @ Princeton Center for Complex Materials
Fischione NanoClean Station @ Imaging and Analysis Center @ Princeton Center for Complex Materials
FTIR-Bruker Hyperion 3000 Microscope; Transmission, Specular Reflectance, ATR, and Relflection Absoprtion @ Materials Characterization Lab @ Center for Nanoscale Science
FTIR-Bruker IFS 66/S and Bruker Vertex V70; Near-IR/Mid-IR/Far-IR, Step Scan, Interchangeable Optical Components @ Materials Characterization Lab @ Center for Nanoscale Science
Glass Knife Maker @ Imaging and Analysis Center @ Princeton Center for Complex Materials
Horiba LabRAM HR Evolution Raman Spectrometer @ The Nanoscale Imaging and Analysis Center (NIAC) at the University of Wisconsin-Madison @ Materials Research Science and Engineering Center on Structured Interfaces
Isitemp Oven @ Imaging and Analysis Center @ Princeton Center for Complex Materials
Leica Sputter Coater @ Imaging and Analysis Center @ Princeton Center for Complex Materials
Low-speed Diamond Saw @ Imaging and Analysis Center @ Princeton Center for Complex Materials
Nanoindentation-Hysitron TriboIndenter TI 900; <1nN Load Resolution, Load or Displacement Controlled Measurments @ Materials Characterization Lab @ Center for Nanoscale Science
Optical Microscope w/CCD Camera @ Imaging and Analysis Center @ Princeton Center for Complex Materials
Plasma Cleaner @ Imaging and Analysis Center @ Princeton Center for Complex Materials
Raman-WITec Confocal Raman @ Materials Characterization Lab @ Center for Nanoscale Science
Reichert-Jung Ultracut E Microtome @ Imaging and Analysis Center @ Princeton Center for Complex Materials
STEM-FEI Titan 3 G2; 0.7A Resolution, EDS, EELS, and EFTEM @ Materials Characterization Lab @ Center for Nanoscale Science
STEM-JEOL 2010F; 2.0A Resolution, EDS, and EELS @ Materials Characterization Lab @ Center for Nanoscale Science
TEM sample cutter @ Imaging and Analysis Center @ Princeton Center for Complex Materials
TEM-JEOL 2010; 2.3A Resolution, EDS, EELS and EFTEM @ Materials Characterization Lab @ Center for Nanoscale Science
TEM-Phillips 420; 3.4A Resolution with EDS @ Materials Characterization Lab @ Center for Nanoscale Science
Thermo Scientific DXRxi Raman imaging microscope @ The Soft Materials Characterization Laboratory (SMCL) at the University of Wisconsin-Madison @ Materials Research Science and Engineering Center on Structured Interfaces
Ultrasonic Cutter @ Imaging and Analysis Center @ Princeton Center for Complex Materials
VCR IBS/TM 200S Ion Bean Sputterer @ Imaging and Analysis Center @ Princeton Center for Complex Materials
Vision Research Phantom High-Speed Cameras @ Image Processing Facility @ Chicago Materials Research Center

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