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Microscopy

Instrument

AFM-Bruker Dimension Icon; contact mode, tapping mode, peakforce tapping, PFQNM, MFM, PRM, EFM, PFKPFM, and SCM @ Materials Characterization Lab @ Center for Nanoscale Science
AFM-Dimension 3100; contact mode, tapping mode, and phase imaging @ Materials Characterization Lab @ Center for Nanoscale Science
Asylum Research Molecular Force Probe 3D atomic force microscope @ Triangle MRSEC Soft Matter Lab @ Research Triangle MRSEC
Auriga 60 CrossBeam (FIB/FE-SEM) @ UD Keck Center for Advanced Microscopy and Microanalysis @ University of Delaware Center for Hybrid, Active, and Responsive Materials
Bruker Hyperion FT-IR Spectrometer & Microscope @ Materials Cluster @ Cornell Center for Materials Research
Carver 25 ton press @ Materials Cluster @ Cornell Center for Materials Research
Confocal Microscope @ Minnesota Nano Center (MNC) @ UMN Materials Research Science and Engineering Center
Dimension-3100 V SPM @ UD Keck Center for Advanced Microscopy and Microanalysis @ University of Delaware Center for Hybrid, Active, and Responsive Materials
ESEM-FEI Quanta 200 Environmental SEM; 10nm Resolution, BSE, EDS, and Temperature Control @ Materials Characterization Lab @ Center for Nanoscale Science
FEI Titan Aberration-corrected (S)TEM @ The Nanoscale Imaging and Analysis Center (NIAC) at the University of Wisconsin-Madison @ Materials Research Science and Engineering Center on Structured Interfaces
FESEM-FEI NanoSEM 630; 1.7nm Resolution, BSE, EDS, Beam Deceleration @ Materials Characterization Lab @ Center for Nanoscale Science
FIB-FEI Quanta 200 3D FIB; 3.5nm SEM Resolution, 10nm Ga+ Beam, Pt GIS, and Selective Carbon Etch GIS @ Materials Characterization Lab @ Center for Nanoscale Science
FIB-FEI Helios NanoLab 660; DualBeam SEM/FIB Platform-pushing the limits of extreme high resolution characterization in 2D an 3D, nanoprototyping, and sample preparation @ Materials Characterization Lab @ Center for Nanoscale Science
JEM-2010F (200kV FE-TEM) @ UD Keck Center for Advanced Microscopy and Microanalysis @ University of Delaware Center for Hybrid, Active, and Responsive Materials
JEM-3010 (300kV TEM) @ UD Keck Center for Advanced Microscopy and Microanalysis @ University of Delaware Center for Hybrid, Active, and Responsive Materials
JSM-7400F (FE-SEM) @ UD Keck Center for Advanced Microscopy and Microanalysis @ University of Delaware Center for Hybrid, Active, and Responsive Materials
LabRamHR Evolution Confocal Raman Microscope @ Materials Preparation and Measurement Laboratory (MPML) @ Chicago Materials Research Center
Leica Cryo-Microtome @ Imaging and Characterization Facility @ CRISP: Center for Research on Interface Structures and Phenomena
Meiji Techno Metallurgical Microscope System @ Triangle MRSEC Soft Matter Lab @ Research Triangle MRSEC
Microtomography Lab: MicroCT @ Utah MRSEC Affiliated Labs @ Next Generation Materials for Plasmonics and Organic Spintronics
MultiMode NanoScope V SPM @ UD Keck Center for Advanced Microscopy and Microanalysis @ University of Delaware Center for Hybrid, Active, and Responsive Materials
Nanoindentation-Hysitron TriboIndenter TI 900; <1nN Load Resolution, Load or Displacement Controlled Measurments @ Materials Characterization Lab @ Center for Nanoscale Science
Olympus BXiS Upright Microscope @ Triangle MRSEC Soft Matter Lab @ Research Triangle MRSEC
Renishaw InVia Confocal Raman microscope @ Materials Cluster @ Cornell Center for Materials Research
STEM-FEI Titan 3 G2; 0.7A Resolution, EDS, EELS, and EFTEM @ Materials Characterization Lab @ Center for Nanoscale Science
STEM-JEOL 2010F; 2.0A Resolution, EDS, and EELS @ Materials Characterization Lab @ Center for Nanoscale Science
Talos F200C (200kV FE-TEM) @ UD Keck Center for Advanced Microscopy and Microanalysis @ University of Delaware Center for Hybrid, Active, and Responsive Materials
Tecnai G2 12 (120kV TEM) @ UD Keck Center for Advanced Microscopy and Microanalysis @ University of Delaware Center for Hybrid, Active, and Responsive Materials
TEM-JEOL 2010; 2.3A Resolution, EDS, EELS and EFTEM @ Materials Characterization Lab @ Center for Nanoscale Science
TEM-Phillips 420; 3.4A Resolution with EDS @ Materials Characterization Lab @ Center for Nanoscale Science
Vibrational (Anasys Nano IR2, FTIR, ATIR, Rama Spectrometer, neaSNOM Microscope) @ UD Advanced Materials Characterization Lab @ University of Delaware Center for Hybrid, Active, and Responsive Materials

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