The JEM 2010 is a 200 kV, high-resolution/analytical hybrid insrument, capable of .19 nm point-to-point resolution. It is equipped with an x-ray spectrometer, a parallel electron energy loss spectrometer (PEELS), a high-resolution, CCD camera system, and a high-resolution TV-rate camera. A high-temperature single-tilt holder (1300 C maximum) is used in situ experimental observations.