Description:

A cold field-emission gun Scanning electron microscope (FEG-SEM).  It operates at 0.5 to 30 kV with an ultimate resolution of 1.0 nm, and a magnification range of 10x to 700,000x.  Available image modes include secondary and backscattered electron imaging.

Equipment:

• JEOL 6700 with a variety of sample holders.
• Backscattered imaging at TV rates and low voltage using the Centaurus detector.

Accessories:

• Back scatter detector
• Chamberscope for optical viewing specimen in the microscope.

Applications:

• Examination of fracture surfaces
• Examination and quantification of nano-scratch tests
• Stereo-imaging of surfaces
• Microstructure of surfactant systems
• Measurement of the width of layers of magnetic read devices
• Characterization of grain boundaries of ceramics

Capabilities:

• Sample size: 50 x 125 x 125 mm
• Lateral resolution: 1.0 nm
• Lateral range: 50 mm x 50 mm