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JEOL JEM-2100F Fast TEM

Instrument types
Make / Model : 

JEOL JEM-2100F

  • Analytical Scanning Transmission Atomic Resolution (A STAR) Electron Microscope
  • High brightness Schottky FEG emitter operated at 200kV -0.1 nm lattice resolution in HRTEM mode
  • 0.2 nm spatial resolution in STEM and analytical mode
  • HAADF STEM detector, Oxford EDS system and Gatan GIF system for atomic resolution Z-contrast imaging, sub-nanoscale resolution
  • EDS and EELS point analysis, and automated line scans and maps
  • Gatan double-tilt heating stage (up to 1100 degrees)
  • Low-Z(Be) double -tilt holder for analytical x-ray microanalysis
  • Hummingbird tomography holder for 3D tomography
  • Remote operation for research and educational purposes