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Nova 600 NovaLab Dual Beam Focused Ion Beam SEM

Instrument types
Make / Model : 

Nova 600 DB-FIB SEM

The Nova 600 is equipped with an EDAX/TSL orientation system and the Hikara high speed EBSD detector and is capable of milling thin layers from the surface using a focused Ga ion beam so that three dimensional orientation data can be collected.