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Johns Hopkins University
Materials Research Science Engineering Center
Surface Characterization Facilities
Instrument Technical Primary Contact:
Peter Searson
More details about this Instrument
Molecular Image Picoscan AFM
Instrument types
Atomic Force Microscopy
News
Shared instrumentation facilities: Benefiting researchers and universities, and sustaining research excellence
Making the Best of a Bad Situation: A Characterization Seminar Series
How NSF's Materials Research Facilities Network helps bolster the field of materials science and engineering
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MRFN.org is supported by the MRSEC Program of the National Science Foundation. Image in the header is courtesy of CRISP MRSEC.