Click on the images to learn more about the capabilities of the instruments.

XRD Capabilities

• Powder Diffraction/Texture Analysis (Pole Figures): Philips XPERT MPD, Bruker D8
• High Resolution Thin Film Diffraction: Philips Materials Research Diffractometer (MRD)
• X-ray Reflectivity/Film Thickness Measurement: Philips MRD, Custom 4-circle
• Residual Stress Measurement: Philips XPERT, Philips MRD
• Small Angle X-ray Scattering: Ultra-SAXS, Intermediate SAXS
• Optical Imaging and Spectroscopy: Nikon microscope, Perkin-Elmer UV/VIS

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