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Central Facility for X-Ray Diffraction

X-Ray Diffraction The facility consists of two computer-controlled Siemens x-ray diffractometers. One has a thin-film glancing angle attachment, high temperature capabilities in both air and vacuum (up to 2000ÂșC), and is equipped with a Laue camera. The other is a high-resolution system used primarily for rocking curve measurements on epitaxial films and other monocrystalline specimens. Director Sheldon is currently converting this facility to a University Cost Center, where users are charged on a per sample basis. This facility is used by researchers from Engineering, Physics, Chemistry, Geology, and the Division of Biology and Medicine.

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No instruments are listed in this facility