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Johns Hopkins University
Materials Research Science Engineering Center
X-Ray Characterization
More details on Facility's page
Access:
External academic, Government, Industry, International
X-Ray Characterization
Instruments
Philips 3720 X-Ray Diffraction System
Philips X'Pert MRD Diffractometer
FEATURES:
Three detectors, angular resolution up to 0.003 degrees
Pole figures
Low angle relectometry
Seven-axis sample positioning
X-Ray Photoelectron Spectrometer
News
Shared instrumentation facilities: Benefiting researchers and universities, and sustaining research excellence
Making the Best of a Bad Situation: A Characterization Seminar Series
How NSF's Materials Research Facilities Network helps bolster the field of materials science and engineering
Read Other News
MRFN.org is supported by the MRSEC Program of the National Science Foundation. Image in the header is courtesy of CRISP MRSEC.