Instrument
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AFM-Bruker Dimension Icon; contact mode, tapping mode, peakforce tapping, PFQNM, MFM, PRM, EFM, PFKPFM, and SCM @
Materials Characterization Lab @
Center for Nanoscale Science
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AFM-Dimension 3100; contact mode, tapping mode, and phase imaging @
Materials Characterization Lab @
Center for Nanoscale Science
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ARES-G2 Rheometer @
Triangle MRSEC Soft Matter Lab @
Research Triangle MRSEC
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Auxiliary Equipment @
The Soft Materials Characterization Laboratory (SMCL) at the University of Wisconsin-Madison @
Materials Research Science and Engineering Center on Structured Interfaces
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Bruker Hyperion FT-IR Spectrometer & Microscope @
Materials Cluster @
Cornell Center for Materials Research
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ESEM-FEI Quanta 200 Environmental SEM; 10nm Resolution, BSE, EDS, and Temperature Control @
Materials Characterization Lab @
Center for Nanoscale Science
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FESEM-FEI NanoSEM 630; 1.7nm Resolution, BSE, EDS, Beam Deceleration @
Materials Characterization Lab @
Center for Nanoscale Science
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FTIR-Bruker Hyperion 3000 Microscope; Transmission, Specular Reflectance, ATR, and Relflection Absoprtion @
Materials Characterization Lab @
Center for Nanoscale Science
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FTIR-Bruker IFS 66/S and Bruker Vertex V70; Near-IR/Mid-IR/Far-IR, Step Scan, Interchangeable Optical Components @
Materials Characterization Lab @
Center for Nanoscale Science
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Instron @
Triangle MRSEC Soft Matter Lab @
Research Triangle MRSEC
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Particle Sizing-Malvern Mastersizer "S"; Laser Diffraction for Coatings, Ceramics, Cosemetics, Cement, Food, and Clays @
Materials Characterization Lab @
Center for Nanoscale Science
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Particle Sizing/Zeta Potential-Malvern Zetasizer ZS; Dynamic Light Scattering for Proteins, Polymers, Micelles, Carbohydrates, Nanoparticles, Colloidal Dispersions, and Emulsions @
Materials Characterization Lab @
Center for Nanoscale Science
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Q-Sense E4 quartz crystal microbalance @
The Soft Materials Characterization Laboratory (SMCL) at the University of Wisconsin-Madison @
Materials Research Science and Engineering Center on Structured Interfaces
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Raman-WITec Confocal Raman @
Materials Characterization Lab @
Center for Nanoscale Science
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Recycling Preparative GPC @
Materials Cluster @
Cornell Center for Materials Research
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Rheometer - Advanced Rheometric Expansion System (ARES) @
The Soft Materials Characterization Laboratory (SMCL) at the University of Wisconsin-Madison @
Materials Research Science and Engineering Center on Structured Interfaces
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SAXS-Molecular Metrology SAXS @
Materials Characterization Lab @
Center for Nanoscale Science
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Surface Area-Gemini 2360 Surface Area Analyer @
Materials Characterization Lab @
Center for Nanoscale Science
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Surface Area-Micromeritics ASAP 2020 @
Materials Characterization Lab @
Center for Nanoscale Science
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Surface Area-Micromeritics ASAP 2920 @
Materials Characterization Lab @
Center for Nanoscale Science
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TA Instruments DHR3 Rheometer @
Materials Cluster @
Cornell Center for Materials Research
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TA Instruments DMA Q800 Dynamic Mechanical Thermal Analysis (DMTA) @
Materials Cluster @
Cornell Center for Materials Research
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TA Instruments Q400EM Thermomechanical Analysis (TMA) @
Materials Cluster @
Cornell Center for Materials Research
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ThermoFisher Capillary Breakup Extensional Rheometer (CaBER) @
Materials Cluster @
Cornell Center for Materials Research
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UV-VIS-NIR-Perkin-Elmer Lambda 950 UV-VIS NIR Spectrophometer @
Materials Characterization Lab @
Center for Nanoscale Science
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Waters MALDI Micro MX (MALDI-TOF) @
Materials Cluster @
Cornell Center for Materials Research
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XPS-Kratos Analytical Axiz Ultra @
Materials Characterization Lab @
Center for Nanoscale Science
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XRD-Multiwire Laue; Back-Reflection Mode for Single Crystal Applications @
Materials Characterization Lab @
Center for Nanoscale Science
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XRD-PANalytical Empryean; Reflection Mode for Powder/Bulk Applications @
Materials Characterization Lab @
Center for Nanoscale Science
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XRD-PANalytical Xpert Pro MPD; Reflection Mode for Powder/Bulk/Thin Film Applications @
Materials Characterization Lab @
Center for Nanoscale Science
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XRD-Phillips MRD; Reflection Mode for Bulk and Thin Film Applications @
Materials Characterization Lab @
Center for Nanoscale Science
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XRD-Rigaku DMAX-Rapid II; Reflection or Transmission Mode for Powder/Bulk/Thin Film/Single Crystal Applications @
Materials Characterization Lab @
Center for Nanoscale Science