Skip to:

Skip to content
Skip to navigation

MRFN Member Login

Program Application

Profilometry

Instrument

Bruker Multimode 8 Atomic Force Microscope (AFM, SPM) @ The Nanoscale Imaging and Analysis Center (NIAC) at the University of Wisconsin-Madison @ Materials Research Science and Engineering Center on Structured Interfaces
Dektak Profilometer @ Central Facility for Microelectronics @ Center for Advanced Materials Research
Filmetrics Optical Profilometer @ Nanostructures Laboratory @ UMass Amherst Materials Research Science and Engineering Center
Keyence VK-X260 Laser-Scanning Confocal Microscope @ Materials Cluster @ Cornell Center for Materials Research
KLA Tencor Alphastep 200 profilometer @ Imaging and Characterization Facility @ CRISP: Center for Research on Interface Structures and Phenomena
Optical Profilometer-ZYGO NewView 7300; Surface Topography, Coating Thickness, Step Height, and 3D Imaging @ Materials Characterization Lab @ Center for Nanoscale Science
Profilometer @ Shared Materials Instrumentation Facility (SMIF) @ Research Triangle MRSEC
Surface Analysis @ Materials Research Laboratory Central Research Facilities @ Illinois MRSEC
Surface Profilometer (3 units) @ The Nanoscale Fabrication Center (NFC) @ Materials Research Science and Engineering Center on Structured Interfaces
Tencor Alpha step 500 @ Materials Cluster @ Cornell Center for Materials Research
Tencor Thin Film Profilometer @ Surface Characterization Facilities @ Materials Research Science Engineering Center
Veeco Dektak Stylus Profilometer @ Nanostructures Laboratory @ UMass Amherst Materials Research Science and Engineering Center
ZYGO 9000 Optical Profilometer @ The Nanoscale Imaging and Analysis Center (NIAC) at the University of Wisconsin-Madison @ Materials Research Science and Engineering Center on Structured Interfaces

People

Jerry Hunter @ Materials Research Science and Engineering Center on Structured Interfaces