Skip to:

Skip to content
Skip to navigation

MRFN Member Login

Program Application

STEM

Instrument

FEI Arctica Thermo Fisher 200kV S/TEM @ Electron Microscopy Cluster @ Cornell Center for Materials Research
FEI F20 TEM STEM @ Electron Microscopy Cluster @ Cornell Center for Materials Research
FEI Strata 400 STEM FIB @ Electron Microscopy Cluster @ Cornell Center for Materials Research
FEI T12 Spirit TEM STEM @ Electron Microscopy Cluster @ Cornell Center for Materials Research
FEI Talos F200X Transmission/Scanning Transmission Electron Microscope (S/TEM) @ Electron Microscopy @ Center for Precision Assembly of Superstratic and Superatomic Solids
FEI Titan 300 kV FEG TEM/STEM System w/EDS & EELS @ Microscopy and Microanalysis Facility @ Materials Research Laboratory: an NSF MRSEC
FEI Titan Aberration-corrected (S)TEM @ The Nanoscale Imaging and Analysis Center (NIAC) at the University of Wisconsin-Madison @ Materials Research Science and Engineering Center on Structured Interfaces
FEI Titan Cryo-S/TEM 300kV @ Electron Microscopy Cluster @ Cornell Center for Materials Research
Hitachi HD-2300A STEM @ Electron Probe Instrumentation Center (EPIC) @ Northwestern University Materials Research Science and Engineering Center
JEM 2800 analytical S/TEM with dual 100mm2 EDS detectors @ Surface Analysis and nano-Scale Imaging in the Micron Technology Foundation, Inc. Microscopy Suite @ Next Generation Materials for Plasmonics and Organic Spintronics
NION UltraSTEM 100 @ Electron Microscopy Cluster @ Cornell Center for Materials Research
STEM-FEI Titan 3 G2; 0.7A Resolution, EDS, EELS, and EFTEM @ Materials Characterization Lab @ Center for Nanoscale Science
STEM-JEOL 2010F; 2.0A Resolution, EDS, and EELS @ Materials Characterization Lab @ Center for Nanoscale Science
Struers Rotopol @ Materials Cluster @ Cornell Center for Materials Research
Tecnai Cryo Transmission Electronc Microscope (TEM) @ The Nanoscale Imaging and Analysis Center (NIAC) at the University of Wisconsin-Madison @ Materials Research Science and Engineering Center on Structured Interfaces
Tecnai TF-30 300KV Field Emission Scanning Transmission Electron Microscope (FE STEM) @ The Nanoscale Imaging and Analysis Center (NIAC) at the University of Wisconsin-Madison @ Materials Research Science and Engineering Center on Structured Interfaces

People