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Johns Hopkins University
Materials Research Science Engineering Center
Electron Microscopy Facilities
Instrument Technical Primary Contact:
Peter Searson
More details about this Instrument
JEOL 6700F Scanning Electron Microscope
Instrument types
SEM
Make / Model :
JEOL 6700F SEM
MICROSCOPE FEATURES:
Cold cathode Field emission gun
1.0 nm resolution at 15 KV
2.2 nm resolution at 1 KV
Backscatter Electron detector (compositional and topographical imaging)
EDX detector
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