The JEOL 7500F scanning electron microscope (SEM) is our dedicated conventional and high-resolution imaging microscope. It is equipped with a range of detectors and imaging modes that allow for the study of a wide range of solid materials. Secondary and backscattered electron detectors allow for imaging of sample surfaces, whereas a scanning-transmission electron detector shows the internal structure of materials. Through a stage biasing system, refered to as the "gentle-beam" mode, the electron beam may be reduced to a fraction of the accelerating voltage at the gun, allowing for the imaging of soft or insulating samples without the need for carbon or metal coating.