- Vibration isolation and sound proof enclosure for low noise operation
- Closed loop scanner with scan range 90 µm x 90 µm
- Z sensor noise level (closed-loop) of 35 pm RMS typical in imaging bandwidth of 625 Hz
- Easy sample positioning with 5-megapixel digital camera with digital zoom and motorized focus
Modes of operation include:
- Atomic Force Microscopy (AFM) mode
- Magnetic Force Microscopy (MFM) mode
- PeakForce Quantitative Nanomechanical Property Mapping (PF-QNM) mode
- Scanned Capacitance Microscopy (SCM) mode
- Spatially resolved electrical characterization mode
MRFN.org is supported by the MRSEC Program of the National Science Foundation. Image in the header is courtesy of CRISP MRSEC.