MRL’s X-Ray analysis suite provides instrumentation for analysis of crystalline structure, orientation and texture, stress, chemical composition, grain and particle size distribution applied to various materials system in powder, thin film on substrate, bulk and liquid form. Dedicated instruments are available for powder, thin film, glancing incidence, texture, stress, reciprocal lattice mapping, fluorescence and reflectometry analysis. The lab also includes a dedicated SAXS/WAXS system for small and wide angles x-ray scattering. Materials databases and software packages are available for search/match, structure refinement, rocking curve and reflectometry simulation and fitting.