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Johns Hopkins University
Materials Research Science Engineering Center
Surface Characterization Facilities
Instrument Technical Primary Contact:
Peter Searson
More details about this Instrument
X-Ray Photoelectron Spectrometer
Make / Model :
PHI 5400 XPS
Features:
Compositional analysis
Oxidation states of ionic solids
Analysis area from 600 nm to 1mm diameter
Composition depth profiles
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