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University of Delaware
University of Delaware Center for Hybrid, Active, and Responsive Materials
UD Keck Center for Advanced Microscopy and Microanalysis
JEM-3010 (300kV TEM)
Instrument types
Microscopy
News
Shared instrumentation facilities: Benefiting researchers and universities, and sustaining research excellence
Making the Best of a Bad Situation: A Characterization Seminar Series
How NSF's Materials Research Facilities Network helps bolster the field of materials science and engineering
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