The MIT MRSEC has a transmission electron microscope (TEM) fitted with Gatan cathodoluminescent attachment. The CL-STEM system makes it possible to characterize nano-structured materials and defects via electron excited optical transitions with spatial resolution that is unattainable with any other technique. This system, which is unique in an academic setting in North America, is well suited to the research of semiconductor nanostructures.
MRFN.org is supported by the MRSEC Program of the National Science Foundation. Image in the header is courtesy of CRISP MRSEC.