FUNCTION: The primary function is to provide general-purpose equipment for X-ray scattering and fluorescence studies. The facility can also provide equipment for non-routine experiments such as, special attachments for high temperatures, vacuum or protective atmospheres, monochromators, special linear and area detectors, etc. Examples of current measurements are: powder diffraction (XRD), single-crystal diffraction, thin-film reflectivity (XRR), thin-film diffraction, crystal truncation rod scattering (CTR), small angle scattering (SAXS), Laue diffraction, pole figures, energy dispersive X-ray Fluorescence spectroscopy, x-ray standing waves, high-resolution x-ray diffraction (HRXRD), and grazing incidence wide-angle scattering (GIWAXS), and GISAXS. The X-ray lab also functions to help prepare students and postdocs for their beamtime at the Advanced Photon Source (APS).
EQUIPMENT:There are presently thirteen experimental x-ray stations available, five of which have rotating anode sources.
COMPUTERS AND SOFTWARE:All of the x-ray stations operate via networked PC's with
software that allows for control via stepping motors and data collection via counters. A
networked printer and wireless network are provided. Available software includes: ICDD PDF4+ database, MDI-JADE xrd analysis, CrystalMaker, and Laue diffraction software packages are available. LINUX based SPEC and NEWPLOT (also used at the APS) are available on four of the stations.
Cu target rotating anode with vertical line source and high-resolution Huber 2-circle diffractometer with Osmic Max-Flux multi-layer mirror wide band-pass monochromator, coupled to a postmonochromator stage for a (111), (220), or (400) Si 2-bounce channel-cut or(111) Ge 2-bounce collimator, SPEC software control, high-count rate s cintillation detector, automated beam attenuator and multi-channel analyzer fluorescence spectroscopy system.
Medium resolution Huber 4-circle diffractometer with double-focusing Graphite (002) monochromator and SPEC software control and automated beam attenuator.
Mo target rotating anode with vertical line source and high-resolution Huber 2-circle diffractometer with Osmic Max-Flux multi-layer mirror wide band-pass monochromator, coupled to (111), (220), or (400) Si 2-bounce channel-cut post-monochromator, SPEC software control, high-count rate scintillation detector, automated beam attenuator and multi-channel analyzer XRF spectroscopy system.
4-Bounce dispersive +- Si(220) monochromator with encoded high-angle resolution rocking curve/scan system. Sealed tube Cu x-ray source.
MDI-JADE powder diffraction analysis software, CrystalMaker diffraction simulation software, ICDD PDF4+ powder diffraction database and Laue analysis software.
A high intensity 18 kW copper x-ray rotating anode source is coupled to a multilayer mirror. The system has selectable x-ray optical configurations suitable for work with single crystal, thin-film or poly-crystalline film samples. Also supported are grazing incidence, in-plane diffraction geometries, pole figures, reciprocal space mapping, and large-size wafer sample mounting.
Automated powder diffraction stations featuring Jade Analysis software.
Rigaku S-MAX 3000 High Brilliance SAXS-WAXS System with a Cu Kα MicroMax source, KB multilayer mirror focusing monochromator, automated sample changer for SAXS-WAXS, and
A high intensity 9 kW copper rotating anode x-ray source is coupled to a multilayer optic.
Automated powder diffraction stations featuring: high temperature environmental chamber for ambient to 1500°C work, a ten sample multi-sample changer, horizontal sample mounting permitting work wi
Automated diffraction system, with four-circle pole-figure and residual stress device, thin film diffraction attachment and solid-state detector.
MRFN.org is supported by the MRSEC Program of the National Science Foundation. Image in the header is courtesy of CRISP MRSEC.
