The Characterization Facility ("CharFac") is a multi-user, shared instrumentation facility for materials research spanning from nanotechnology to biology and medicine. Our analytical capabilities include microscopy via electron beams, force probes and visible light; elemental and chemical imaging including depth profiling; elemental, chemical and mass spectroscopy; atomic and molecular structure analysis via X-ray, ion or electron scattering; nanomechanical and nanotribological probes; and other tools for surface and thin-film metrology. CharFac resides administratively under the College of Science and Engineering with additional support from the Medical School. Well over 100 faculty research programs use our capabilities; these researchers originate from dozens of University of Minnesota departments under several colleges. We also work with some 60 industrial companies in a typical year, ranging from small start-ups to multinational corporations; these interactions include analytical service, training for independent use, and research collaboration. Finally, we are supported by the National Science Foundation as a key node in the National Nanotechnology Infrastructure Network to work with external academic institutions including research universities, 4-year colleges, technical colleges, and K-12 schools
This small-angle scattering beamline incorporates high-flux optics, in situ control of sample temperature, and an area detector. The intense beam generated by this instrument makes it ideal for obtaining time-resolved measurements, such as crystallization behavior, phase transformation kinetics, and response to mechanical deformation. Samples can be analyzed in many forms, including solutions, fibers, films, and powders.
Small-angle x-ray scattering is useful for structural analysis of liquid crystal, microemulsions and polymer films. The six meter small angle x-ray scattering (SAXS) line combines cross-coupled multilayer parallel beam optics, pinhole collimation and a long sample-to-detector distance to create a system with high resolution at low Bragg angles. In addition to the regular sample holder there is the option of simultaneous SAXS and rheometry (shearing), differential scanning calorimetry, or mechanical manipulation of the sample.
A Cold Field Emission Gun Scanning Electron Microscope (FEGSEM) of "below‑the‑lens" design capable of (manufacturer's claims) 1.5 nm resolution at 15 kV, 12 mm W.D.; and 2.5 nm resolution at 1 k, 2.5 mm W.D. Magnification ranges from 30X to 500,000X. Specimen tilt at 12 mm W.D.
The Bruker D8 Discover is a Cu Kα radiation point source, two dimensional x-ray diffractometer that specializes in spatially resolved x-ray diffraction analysis and x-ray diffraction on very small sample volumes. This diffractometer is ideal for inhomogenous samples, small devices, and three-dimensional objects where discrete regions of a sample are required for x-ray diffraction analysis.
This is a field-emission gun Transmission Electron Microscope operable up to 300kV. The high-brightness, high coherency gun allow large electron probe currents to be focused onto nanometer sized areas of the specimen. High tilt capabilities (up to 70°) allow crystallography studies. It is equipped with an Electron Energy-Loss Gatan Imaging Filter to study low-Z elements. Images can be recorded using two different CCD cameras or f
A cold field-emission gun Scanning electron microscope (FEG-SEM). It operates at 0.5 to 30 kV with an ultimate resolution of 1.0 nm, and a magnification range of 10x to 700,000x. Available image modes include secondary and backscattered electron imaging.
A field emission gun transmission electron microscope (FEG-TEM) with an operating voltage range of 50 to 300 kV. The high-brightness, high-coherency gun allows large electron probe currents to be focused onto nanometer-sized areas of the specimen. Capabilities include energy-dispersive X-ray spectroscopy (EDS), electron energy loss spectroscopy (EELS), STEM imaging and mapping, and a CCD camera that allows magnification of thin sam
FTIR spectroscopy is used for structural characterization of organic and inorganic molecules in solids, liquids, gases, and on surfaces. Qualitative and quantitative information about the molecule may be obtained.
Ion Beam Analysis (IBA) uses a high-energy, light ion beam (typically He++, i.e., nuclei: alpha particles) to probe elemental composition as a function of depth to several microns with a depth resolution of 50-200 angstroms. It is a fast, nondestructive (i.e., nonsputtering) and standardless technique to quantify the absolute atomic ratios (stoichiometry) in compounds or mixtures, insensitive to their chemical environments. It can also determine the film thickness given knowledge of atomic density, or density (i.e., porosity) give
Wide-angle X-ray scattering is used to study structural characteristics and to identify powders, thin films, and crystals.
The NanoIndenter performs indentation tests by driving a diamond indenter into the specimen surface and dynamically collecting the applied force and displacement data. Material properties are derived from the load and depth data. Specimens are typically relatively smooth and flat.
The Panalytical X'Pert Diffractometer is a highly advanced, versatile materials characterization system. Interchangeable PreFIX incident and diffracted beam optics can be configured for optimal measurement of high resolution scans, reflectivity experiments, or for in-plane diffraction.
Wide-angle X-ray scattering is used to study structural characteristics and to identify powders, thin films, and crystals. Data analysis is performed using Materials Data Incorporated's JADE 7.0 software package with whole pattern fitting. Phase identification is possible using ICDD's PDF-4 database.
A transmission electron microscope (TEM) with an operating voltage range of 20 to 120 kV. Capabilities include magnifications of thin samples (<200 nm) up to 700,000 times, an energy-dispersive X-ray spectroscopy (EDS) system, a Gatan MSC794 CCD camera for digital image acqusition, and a video camera for video-rate recording at moderate magnifications.
The Tecnai G2 Spirit BioTWIN, a 20-120 kV / LaB6 Transmission Electron Microscope, is a general-purpose instrument that is specifically suited for low contrast samples. It enables the user to explore the native state of low-contrast, beam-sensitive biological specimens, or other soft materials like polymers. Samples can be unstained or stained. The lens design guarantees maximum contrast. Our Tecnai Spirit is cryo-capable.
The Triboindenter performs indentation tests by driving a diamond indenter into the specimen surface and dynamically collecting the applied force and displacement data. Material properties are derived from the load and depth data. Specimens are typically relatively smooth and flat.
Our "Video Enhanced Microscope" consists of a Nikon Optiphot light microscope along with a new Canon SL1 digital camera.
The Nikon microscope has capabilities for transmitted light (brightfield and polarized) along with reflected light (brightfield, darkfield, polarized and DIC) illumination modes. Objectives available are 5x, 10x, 20x, and 50x dry, along with a 100x oil immersion (numerical aperture of 1.25).
Wide-angle x-ray scattering is used to study structural characteristics and to identify solids, powders, thin films, and solutions. Data analysis is performed using Materials Data Incorporated's JADE 8.0 software package with whole pattern fitting. Phase identification is possible using ICDD's PDF-4 database.
Wide-angle x-ray scattering is used to study structural characteristics and to identify powders, thin films, crystals, and solutions. Data analysis is performed using Materials Data Incorporated's JADE 7.0 software package with whole pattern fitting. Phase identification is possible using ICDD's PDF-4 database. The 40 position sample changer can be used to analyze a large number of samples automatically.
MRFN.org is supported by the MRSEC Program of the National Science Foundation. Image in the header is courtesy of CRISP MRSEC.
