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FEI Titan Aberration-corrected (S)TEM

Instrument types
Make / Model : 

FEI FG-200

This FEI STEM instrument is configured with a CEOS probe-side aberration corrector, which provides revolutionary performance in STEM imaging and microanalysis. Imaging single atoms, and nanoscale Chemical and Structure analysis. With <0.08 nm spatial resolution Zcontrast STEM imaging, <0.1 nm spatial resolution HRTEM imaging. It is fully equipped for analytical analysis with EDS and electron energy loss spectrometers.