The Bruker Dimension Edge AFM measures nanometer-scale microscopy by rastering (over a surface of interest) a sharp probe, the z-position of which is controlled in a closed-loop feedback on a measure of the atomic forces on the probe by the surface. These forces are strongly dependent on the probe-surface distance, and so the z-adjustments required to maintain constant force during rastering are directly related to the topographical and morphological features.
The Bruker Dimension Icon AFM measures nanometer-scale microscopy by rastering (over a surface of interest) a sharp probe, the z-position of which is controlled in a closed-loop feedback on a measure of the atomic forces on the probe by the surface. These forces are strongly dependent on the probe-surface distance, and so the z-adjustments required to maintain constant force during rastering are directly related to the topographical and morphological features.
The Discover SP Microwave synthesizer (CEM) allows for rapid heating of solvents up to 300 °C and pressures up to 300 psi. Reaction vessels can be prepared in a glovebox and will maintain inert environment while capped allowing for air free synthesis. Reaction conditions are monitored over time through software and can be saved for comparison between syntheses. Reactions are rapidly cooled down following synthesis by flowing compressed air around the reaction vessel.
Boehler-Almax plate DAC with gas membrane for pneumatic pressure control. This DAC features a gas membrane which allows for simple pressure manipulation meaning the user can easily acquire data at a variety of pressure points. The device can easily integrate with the Edinburgh Fluorometer via a microscope for luminescence and lifetime measurements. The setup also contains a high-precision microdriller for drilling of DAC gaskets through electric discharge machining.
The Edinburgh FLS1000 system is a modular fluorescence spectrometer for measuring spectra from the ultraviolet to the near-infrared spectral range (250 to 2550 nm), and lifetimes spanning from picoseconds to seconds. The system currently houses three light sources (450 W ozone-free Xenon arc lamp, microsecond Xenon flashlamp, 405nm picosecond pulsed diode laser), three detectors (Si PMT, InGaAs PMT, and InGaAs steady-state detector), an integrating sphere attachment for measuring absolute photoluminescence quantum yields, and a fiber optics module for external measurements.
The NanoITC is a state-of-the-art isothermal titration calorimeter (ITC) that is designed to handle large sample volumes while maintaining a small instrument footprint and allows thermodynamic measurements on systems like nanocrystal doping and surface-binding reactions. The ITC can measure reactions in organic solvents as well as under inert atmosphere. The instrument has extremely high sensitivity and can measure heat down to 0.1uJ with minimum noise. The instrument accommodates a large sample volume of 1.6mL and allows for two different volumes of titrant to be used.
This custom XES instrument consists of two independent, integrated spectrometers simultaneously measuring phosphorus Kα and Kβ XES. While the Kα XES gives information on oxidation state distribution, the Kβ XES gives additional information about electronic structure, including sensitivities such as ligand identity, symmetry, and bonding information. This dual capability system allows measurement of both of these channels for maximum information content of each sample.
Pulsed laser deposition (PLD) is a laser-based technique used to grow high-quality thin films of complex materials on substrates like Silicon wafers. The material to be deposited (target) is vaporized by short and intense laser pulses and forms a plasma plume. Then, the vaporized target material from the plasma bombards the substrate and creates a thin homogenous layer on this substrate. For each laser shot, a layer of only a few nanometers of material is ablated to form the plasma plume in a process that typically lasts a few tens of picoseconds.
This custom deposition system is a modular instrument for preparation of thin film metal-halide perovskite materials. The vacuum chamber is equipped with a Pfeiffer ACP40 backing pump and a 10″ Pfeiffer turbo pump allowing fast pump down times to a base pressure of ~1×10-5 torr. Substrates up to 12″ x 12″ can be accommodated on a linear translation rail. The vacuum chamber has numerous feedthroughs on its base and side walls that allow for installation and testing of custom deposition sources.
The Xeuss 3.0 is the latest generation instrument for Small Angle X-ray Scattering and is already installed in leading research facilities around the world. It incorporates all the latest innovations from Xenocs for added capabilities, flexibility and ease-of-use.
MRFN.org is supported by the MRSEC Program of the National Science Foundation. Image in the header is courtesy of CRISP MRSEC.
