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Focused Ion Beam

People

Instrument

FEI DB235 Dual-Beam Focus Ion Beam System (FIB) w/ EDS @ Microscopy and Microanalysis Facility @ Materials Research Laboratory: an NSF MRSEC
FEI FIB @ Minnesota Nano Center (MNC) @ UMN Materials Research Science and Engineering Center
FEI Helios Dual Beam FIB with an Omniprobe nanomanipulator and autoTEM sample preparation @ Central Facility for Electron Microscopy @ Center for Advanced Materials Research
FEI Helios G3 DualBeam FIB/SEM with EDS @ Imaging and Analysis Center @ Princeton Center for Complex Materials
FEI Helios Nanolab 600 Dual Beam Focused Ion Beam/Scanning Electron Microscope @ NanoSystems Laboratory (NSL) @ Center for Emergent Materials
FEI Nova 600 Dual-Beam Focused Ion Beam System @ Fabrication and Processing @ Materials Research Science Engineering Center
FEI Strata 200xp Focused-Ion Beam Workstation @ Nanofabrication and Clean-Room @ UNL Materials Research Science and Engineering Center
FEI Strata 400 STEM FIB @ Electron Microscopy Cluster @ Cornell Center for Materials Research
FEI Strata DB235 Focused Ion Beam @ Electron Microscopy Facility @ The Laboratory for Research on the Structure of Matter
FEI StrataTM DB 235 FIB @ Imaging and Analysis Center @ Princeton Center for Complex Materials
FIB-FEI Quanta 200 3D FIB; 3.5nm SEM Resolution, 10nm Ga+ Beam, Pt GIS, and Selective Carbon Etch GIS @ Materials Characterization Lab @ Center for Nanoscale Science
FIB-FEI Helios NanoLab 660; DualBeam SEM/FIB Platform-pushing the limits of extreme high resolution characterization in 2D an 3D, nanoprototyping, and sample preparation @ Materials Characterization Lab @ Center for Nanoscale Science
Focused Ion Beam
Focused Ion Beam @ Nanofabrication Facility @ CRISP: Center for Research on Interface Structures and Phenomena
Ion Beam Analysis @ Characterization Facility (CharFac) @ UMN Materials Research Science and Engineering Center
Tescan S8252G Raman - SEM/FIB @ Characterization Laboratory @ Renewable Energy Materials Research Science and Engineering Center
Thermo Fisher Helios G4 UX Focused Ion Beam @ Electron Microscopy Cluster @ Cornell Center for Materials Research
ThermoFisher Helios G4 UX Plasma Focused Ion Beam/Field Emission Scanning Electron Microscope @ The Nanoscale Imaging and Analysis Center (NIAC) at the University of Wisconsin-Madison @ Materials Research Science and Engineering Center on Structured Interfaces
Zeiss Auriga Focused Ion Beam FIB/FESEM @ The Nanoscale Imaging and Analysis Center (NIAC) at the University of Wisconsin-Madison @ Materials Research Science and Engineering Center on Structured Interfaces